Scanning Electron Microscopy

A scanning electron microscope, equipped with an x-ray analyser, can produce superior images to those available from an optical microscope, offering far greater magnification and depth of field. Electron microscopy produces an accurate analysis of material surfaces and chemical composition, which is particularly useful in forensic investigations.

• Magnification from x 5 to over x 100,000
• Depth of field up to 1,000 times greater than optical microscope
• Samples up to 20mm deep and several cm wide can be analysed
• Samples as small as 0.5µm can be analysed
• Detects elements of atomic number 5 (carbon) or greater

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The surface of a fracture, seen under an electron microscope, can often reveal a great deal of information about the nature and cause of a fracture. SEM analysis allows examination of the microstructure of a material and its composition. These are useful in accessing the grade of material that has been used in a component or defects in manufacturing. Electron Microscopy can also be used for assessing the quality of and identifying degradation in a wide range of material samples used in the manufacture of electrical network assets and other components.

The addition of an x-ray analyser further enhances this service, allowing us to include chemical analysis quickly and easily. This is of particular value in identifying the nature and source of contamination or corrosion.