Materials Testing & Analysis Services

The scanning electron microscope (SEM) equipped with an X-ray analyser is another valuable analytical technique, which is considered to be an essential tool for investigative failure and forensic examinations.

The SEM produces images with a resolution and depth of superior to those of a light microscope. An image is produced by scanning an electron beam which is focused into a small spot over the surface of a sample. The interaction of the beam produces high energy and low energy electron signals which re used for producing an image, and characteristic X-rays which are used for chemical analysis.

The sample surface can be imaged at magnifications from X5 to greater than X100,000 with a depth of field between 300 and 1,000 times greater than an optical microscope. This makes the SEM an ideal tool for the examination of rough surfaces including fracture surfaces.

Analysis of all the elements from carbon upward in the periodic table can be carried out and the limit of detection is typically 0.1 wt%. Elemental analysis, both qualitative and quantitative, can be obtained in a matter of minutes, of a small or large area of a sample. With a stationary incident electron beam X-ray data can be obtained from a very small volume with a diameter less than 0.5µm.

Specimens up to several cms2 in area and up to approximately 2cms deep can be examined non-destructively. Specimen preparation is quick and simple. Like the optical microscope the range of applications is very broad.



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